IEEE Std 1671.3-2007
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

Standard No.

IEEE Std 1671.3-2007

Release Date

2008

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced 2018-04

Replace By

IEEE Std 1671.3-2017

Latest

IEEE Std 1671.3-2017

Scope

This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).

IEEE Std 1671.3-2007 history

• 2018 IEEE Std 1671.3-2017 IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
• 2008 IEEE Std 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information