IEEE Std 1671.3-2017
IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

Standard No.

IEEE Std 1671.3-2017

Release Date

2018

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE Std 1671.3-2017

Scope

An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.

IEEE Std 1671.3-2017 history

• 2018 IEEE Std 1671.3-2017 IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
• 2008 IEEE Std 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information