This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752.
SAE J1752-3-2017 history
2017SAE J1752-3-2017 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
2011SAE J1752-3-2011 Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz)@ Wideband TEM Cell (150 kHz to 8 GHz)
2003SAE J1752-3-2003 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
1995SAE J1752-3-1995 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit Radiated Emissions Measurement Procedure 150 kHz to 1000 MHz@ TEM Cell@ Recommended Practice (March 1995)