SAE J1752-3-2003
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

Standard No.

SAE J1752-3-2003

Release Date

2003

Published By

SAE - SAE International

Status

Be replaced 2017-09

Replace By

SAE J1752-3-2011

Latest

SAE J1752-3-2017

SAE J1752-3-2003 history

• 2017 SAE J1752-3-2017 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 2011 SAE J1752-3-2011 Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz)@ Wideband TEM Cell (150 kHz to 8 GHz)
• 2003 SAE J1752-3-2003 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 1995 SAE J1752-3-1995 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit Radiated Emissions Measurement Procedure 150 kHz to 1000 MHz@ TEM Cell@ Recommended Practice (March 1995)