SAE AS6171/2A-2017
Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection@ Remarking and Resurfacing@ and Surface Texture Analysis Test Methods

Standard No.

SAE AS6171/2A-2017

Release Date

2017

Published By

SAE - SAE International

Latest

SAE AS6171/2A-2017

Scope

This document describes the requirements of the following test methods for counterfeit detection of electronic components Method A: General EVI@ Sample Selection@ and Handling Method B: Detailed EVI@ including Part Weight measurement Method C: Testing for Remarking Method D: Testing for Resurfacing Method E: Part Dimensions measurement Method F: Surface Texture Analysis using SEM The scope of this document is focused on leaded electronic components@ microcircuits@ multi-chip modules (MCMs)@ and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract@ the base document@ AS6171 General Requirements shall also apply Purpose This standard establishes requirements for the inspection process@ documentation of results@ personnel qualification@ and the inspection equipment to be used. It also outlines techniques to detect suspect counterfeit parts by a trained inspector

SAE AS6171/2A-2017 history

• 2017 SAE AS6171/2A-2017 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection@ Remarking and Resurfacing@ and Surface Texture Analysis Test Methods

SAE AS6171/2A-2017 -All Parts