SAE AS6171/2-2016 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection@ Remarking and Resurfacing@ and Surface Texture Analysis Test Methods
This document describes the requirements of the following test methods for counterfeit detection of electronic components: a. Method A: General External Visual Inspection (EVI)@ Sample Selection@ and Handling b. Method B: Detailed EVI c. Method C: Testing for Remarking and Resurfacing d. Method D: Surface Texture Analysis by SEM NOTE: The scope of this document was focused on leaded electronic components@ microcircuits@ multi-chip modules (MCMs)@ and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. Purpose Statement This standard establishes requirements for the inspection process@ documentation of results@ personnel qualification@ and the inspection equipment to be used. It also outlines techniques to detect suspect counterfeit parts by a trained inspector.
SAE AS6171/2-2016 history
2017SAE AS6171/2A-2017 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection@ Remarking and Resurfacing@ and Surface Texture Analysis Test Methods
2016SAE AS6171/2-2016 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection@ Remarking and Resurfacing@ and Surface Texture Analysis Test Methods