GB/T 42706.2-2023
Long-term storage of electronic components and semiconductor devices Part 2: Degradation mechanisms (English Version)

Standard No.

GB/T 42706.2-2023

Language

Chinese, Available in English version

Release Date

2023

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 42706.2-2023

Introduction

GB/T 42706.2-2023 "Electronic Components - Semiconductor Devices for Long-Term Storage - Part 2: Degradation Mechanisms" is a national standard of China that addresses the degradation mechanisms of semiconductor devices during long-term storage. This standard provides guidelines and recommendations for the proper storage of semiconductor devices to minimize their degradation over time. It covers various factors that can contribute to the degradation of these devices, including temperature, humidity, and exposure to light. The standard emphasizes the importance of controlling the storage environment to ensure the longevity and reliability of semiconductor devices. It provides specific temperature and humidity ranges for storage, as well as recommendations for packaging and handling procedures. By adhering to the guidelines outlined in GB/T 42706.2-2023, manufacturers, suppliers, and users of semiconductor devices can better understand the degradation mechanisms and take appropriate measures to mitigate them. This standard aims to enhance the quality and performance of semiconductor devices during their storage period, ultimately benefiting industries such as electronics, telecommunications, and automotive. In conclusion, GB/T 42706.2-2023 is a comprehensive standard that focuses on the degradation mechanisms of semiconductor devices during long-term storage. Its guidelines and recommendations aim to ensure the reliability and longevity of these devices, contributing to the overall quality of electronic products.

GB/T 42706.2-2023 history

• 2023 GB/T 42706.2-2023 Long-term storage of electronic components and semiconductor devices Part 2: Degradation mechanisms

GB/T 42706.2-2023 -All Parts