SAE SSB1_002-1999
Environmental Tests and Associated Failure Mechanisms (Annex to SSB-1@ Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military@ Aerospace and Other Rugged Applications; Formerly TechAmerica SSB-1.002)

Standard No.

SAE SSB1_002-1999

Release Date

1999

Published By

SAE - SAE International

Status

Be replaced 2014-09

Replace By

SAE SSB1_002-2014

Latest

SAE SSB1_002-2014

Scope

This document is an annex to EIA Engineering Bulletin SSB-1@ Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military@ Aerospace and Other Rugged Applications (the latest revision). This document provides reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors@ and the specific failures induced by these environmental stresses.

SAE SSB1_002-1999 history

• 2014 SAE SSB1_002-2014 Environmental Tests and Associated Failure Mechanisms
• 1999 SAE SSB1_002-1999 Environmental Tests and Associated Failure Mechanisms (Annex to SSB-1@ Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military@ Aerospace and Other Rugged Applications; Formerly TechAmerica SSB-1.002)