GJB 762.2-1989
Semiconductor device radiation hardening test method gamma total dose irradiation test (English Version)

Standard No.

GJB 762.2-1989

Language

Chinese, Available in English version

Release Date

1989

Published By

Military Standard of the People's Republic of China-General Armament Department

Status

Be replaced 2016-03

Replace By

GJB 762.2-1989(XG1-2015)

Latest

GJB 762.2-1989(XG1-2015)

GJB 762.2-1989 history

• 0000 GJB 762.2-1989(XG1-2015)
• 1989 GJB 762.2-1989 Semiconductor device radiation hardening test method gamma total dose irradiation test