GJB 762.2-1989(XG1-2015)
Semiconductor device radiation hardening test method γ total dose irradiation test modification sheet 1-2015 (English Version)

Standard No.

GJB 762.2-1989(XG1-2015)

Language

Chinese, Available in English version

Release Date

2015

Published By

Military Standard of the People's Republic of China-General Armament Department

Latest

GJB 762.2-1989(XG1-2015)

GJB 762.2-1989(XG1-2015) history

• 0000 GJB 762.2-1989(XG1-2015)
• 1989 GJB 762.2-1989 Semiconductor device radiation hardening test method gamma total dose irradiation test