This part of SAE J1113 specifies TEM cell test methods and procedures for testing the electromagnetic immunity of electronic components (DUTs) for passenger cars, commercial vehicles and similar applications. Methods using the constant cross-section TEM cell (Crawford TEM) and the flared cross-section TEM cell (wideband TEM) are discussed in the document. The electromagnetic disturbance considered in this part of SAE J1113 will be limited to continuous narrowband electromagnetic fields. TEM cells produce both electric and magnetic fields simultaneously. The test is directly applicable to DUTs whose height is less than 1/3 the septum height; somewhat larger modules can be tested with conditions applied. The Crawford TEM and wideband TEM cell may be used for testing within the 1/3 height condition without demonstrating field uniformity within the cell, if the test set-up complies with the other provisions of this standard. This test can be used for two purposes: a.
SAE J1113/24-2010 history
2010SAE J1113/24-2010 Immunity to Radiated Electromagnetic Fields; 10 kHz to 200 MHz - Crawford TEM Cell and 10 kHz to 5 GHz - Wideband TEM Cell
2006SAE J1113/24-2006 Immunity to Radiated Electromagnetic Fields; 10 kHz to 200 MHz Crawford TEM Cell and 10 kHz to 5 GHz Wideband TEM Cell
2000SAE J1113/24-2000 Immunity to Radiated Electromagnetic Fields; 10 kHz to 200 MHz Crawford TEM Cell and 10 kHz to 5 GHz Wideband TEM Cell