KS C 0256-2022
Testing method of resistivity for silicon crystals and silicon wafers with four - point probe

Standard No.

KS C 0256-2022

Release Date

2022

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS C 0256-2022

KS C 0256-2022 history

• 2022 KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• 0000 KS C 0256-2002(2017)
• 2002 KS C 0256-2002 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• 0000 KS C 0256-1999