IEC 61000-4-11:2017
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Standard No.

IEC 61000-4-11:2017

Release Date

2017

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2017-05

Replace By

IEC 61000-4-11:2004/AMD1:2017

Latest

IEC 61000-4-11:2020/COR2:2022

Scope

This part of IEC 61000 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks. It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks. Tests for these networks will be covered by future IEC standards. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. NOTE Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products.

IEC 61000-4-11:2017 history

• 2022 IEC 61000-4-11:2020/COR2:2022 Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
• 2020 IEC 61000-4-11:2020/COR1:2020 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16
• 0000 IEC 61000-4-11:2020 RLV
• 2017 IEC 61000-4-11:2004/AMD1:2017 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests; Amendment 1
• 2017 IEC 61000-4-11:2017 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• 2010 IEC 61000-4-11:2004/ISH1:2010 Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• 2004 IEC 61000-4-11:2004 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• 2001 IEC 61000-4-11:2001 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measuring techniques; Voltage dips, short interruptions and voltage variations immunity tests
• 1970 IEC 61000-4-11:1994/AMD1:2000 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests
• 1994 IEC 61000-4-11:1994 Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests