DIN 51457:2017
Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization
- Standard No.
- DIN 51457:2017
- Release Date
- 2017
- Published By
- German Institute for Standardization
- Status
- Replace By
- DIN 51457:2017-05
- Latest
- DIN 51457:2023-11
- Replace
- DIN 51457:2016
DIN 51457:2017 Referenced Document
- DIN 1319-3:1996 Fundamentals of metrology - Part 3: Evaluation of measurements of a single measurand, measurement uncertainty
- DIN 1319-4:1999-02 Fundamentals of metrology - Part 4: Evaluation of measurements; uncertainty of measurement
- DIN 1333:1992 Presentation of numerical data
- DIN 32645:2008 Chemical analysis - Decision limit, detection limit and determination limit under repeatability conditions - Terms, methods, evaluation
- DIN 51061:2017 Testing of ceramic raw and finished materials - Sampling of ceramic raw materials
- DIN 51701-2:2006 Testing of solid fuels - Sampling and sample preparation - Part 2: Sampling
- DIN 51940:2012-03 Testing of carbonaceous materials - Sampling and sample preparation - Solid materials, solid binders and impregnants
DIN 51457:2017 history
- 2023 DIN 51457:2023-11 Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrotherma...
- 2017 DIN 51457:2017-05 Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporizati...
- 2017 DIN 51457:2017 Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization
- 1970 DIN 51457 E:2016-11
- 1970 DIN 51457 E:2015-05
