IEC 62047-40:2021
Semiconductor devices - Micro-electromechanical devices - Part 40: Test methods of micro-electromechanical inertial shock switch threshold

Standard No.

IEC 62047-40:2021

Release Date

2021

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 62047-40:2021

Replace By

IEC 47F/384/FDIS:2021

Scope

This part of IEC 62047 specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro- electromechanical inertial shock switch.

IEC 62047-40:2021 history

• 2021 IEC 62047-40:2021 Semiconductor devices - Micro-electromechanical devices - Part 40: Test methods of micro-electromechanical inertial shock switch threshold