BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices. Test method for adhesion strength of metal powder paste in MEMS interconnection

Standard No.
BS IEC 62047-38:2021
Release Date
2021
Published By
British Standards Institution (BSI)
Latest
BS IEC 62047-38:2021

BS IEC 62047-38:2021 history

  • 2021 BS IEC 62047-38:2021 Semiconductor devices. Micro-electromechanical devices. Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices. Test method for adhesion strength of metal powder paste in MEMS interconnection



Copyright ©2023 All Rights Reserved