JIS Z 4334:2019
Reference sources -- Calibration of surface contamination monitors -- Alpha-, beta- and photon emitters

Standard No.
JIS Z 4334:2019
Release Date
2019
Published By
Japanese Industrial Standards Committee (JISC)
Latest
JIS Z 4334:2019
Replace
JIS Z 4334:2005

JIS Z 4334:2019 history

  • 2019 JIS Z 4334:2019 Reference sources -- Calibration of surface contamination monitors -- Alpha-, beta- and photon emitters
  • 2005 JIS Z 4334:2005 Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters
  • 1992 JIS Z 4334:1992 Reference sources for the calibration of surface contamination monitors



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