2019JIS Z 4334:2019 Reference sources -- Calibration of surface contamination monitors -- Alpha-, beta- and photon emitters
2005JIS Z 4334:2005 Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters
1992JIS Z 4334:1992 Reference sources for the calibration of surface contamination monitors