ISO 17915:2018 PDF

Scope: This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications. This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

ISO 17915:2018 Referenced Document

IEC 60747-5-1:1997 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60747-5-2:1997 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
IEC 60825:1984 Radiation safety of laser products, equipment classification, requirements and user's guide
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
ISO 11145:2016 Optics and photonics - Lasers and laser-related equipment - Vocabulary and symbols
ISO 13695:2004 Optics and photonics - Lasers and laser-related equipment - Test methods for the spectral characteristics of lasers

2018 ISO 17915:2018 Optics and photonics - Measurement method of semiconductor lasers for sensing