IEEE 1671.3-2017
Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

Standard No.

IEEE 1671.3-2017

Release Date

2017

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE 1671.3-2017

IEEE 1671.3-2017 history

• 2017 IEEE 1671.3-2017 Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
• 2007 IEEE 1671.3-2007 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information