GB/T 36477-2018
Semiconductor integrated circuit.Measuring methods for flash memory (English Version)

Standard No.

GB/T 36477-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 36477-2018

Scope

This standard specifies the basic methods for testing electrical parameters, time parameters and memory cell functions of semiconductor integrated circuit flash memory. This standard applies to the testing of electrical parameters, time parameters and memory cell functions of flash memory in the field of semiconductor integrated circuits.

GB/T 36477-2018 Referenced Document

• GB/T 17574-1998 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits

GB/T 36477-2018 history

• 2018 GB/T 36477-2018 Semiconductor integrated circuit.Measuring methods for flash memory