This part of IEC 62899 specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
IEC 62899-402-1:2017 Referenced Document
ISO 291:2008 Plastics - Standard atmospheres for conditioning and testing
IEC 62899-402-1:2017 history
2017IEC 62899-402-1:2017 Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width