IEC 62435-2:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
- Standard No.
- IEC 62435-2:2017
- Release Date
- 2017
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 62435-2:2017
- Replace
- IEC 47/2327/FDIS:2016
- Scope
- This part of IEC 62435 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1 for any device long- term storage whose duration may be more than 12 months for product scheduled for long duration storage. Mechanisms that apply to specific component types are detailed in IEC 62435-5 to IEC 62435-9 (proposed).
IEC 62435-2:2017 Referenced Document
- IEC 60749-20-1:2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
IEC 62435-2:2017 history
- 2017 IEC 62435-2:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
