BS EN 62276:2016 PDF

BS EN 62276:2016 Referenced Document

ANSI/IEEE Std 176-1987 IEEE Standard on Piezoelectricity
ASTM F533 Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
EN 61019-1 Surface acoustic wave (SAW) resonators Part 1: Generic specification
EN 61019-2 Surface acoustic wave (SAW) resonators Part 2: Guide to the use
EN ISO 4287:1998 Geometrical product specification (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters Incorporates Amendment A1: 2009
IEC 60862-1 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60862-2 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guide for the use
IEC 60862-3 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
IEC 61019-1 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 61019-2 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 61019-3 Surface acoustic wave (SAW) resonators; part 3: standard outlines and lead connections
ISO 2859-1:1989 Sampling procedures for inspection by attributes — Part 1: Sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection
ISO 4287:1997 Geometrical Product Specification (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters

2016 BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
2013 BS EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
2006 BS EN 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods