BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Standard No.

BS EN 60749-44:2016

Release Date

2016

Published By

British Standards Institution (BSI)

Latest

BS EN 60749-44:2016

BS EN 60749-44:2016 Referenced Document

• IEC 62396-4 Process management for avionics - Atmospheric radiatio effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
• IEC 62396-5 Process management for avioncs - Atmospheric radioation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems

BS EN 60749-44:2016 history

• 2016 BS EN 60749-44:2016 Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices