JEDEC JEP151-2015
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

Standard No.

JEDEC JEP151-2015

Release Date

2015

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Latest

JEDEC JEP151-2015

JEDEC JEP151-2015 history

• 2015 JEDEC JEP151-2015 Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices