General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
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GB/T 14031-1992
Scope
This standard specifies the basic principles of the electrical parameter test methods for semiconductor integrated circuit analog phase-locked loops (hereinafter referred to as devices or analog phase-locked loops).
GB/T 14031-1992 history
1992GB/T 14031-1992 General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits