General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
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GB/T 14114-1993
Scope
This standard specifies the basic principles of test methods for semiconductor integrated circuit voltage/frequency and frequency/voltage converters (hereinafter referred to as devices). This standard applies to electrical parameter tests of semiconductor integrated circuit voltage/frequency and frequency/voltage converters.
GB/T 14114-1993 history
1993GB/T 14114-1993 General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits