5.1 This test method is useful for the determination of concentrations of metals in many waste streams from various nuclear and non-nuclear manufacturing processes. The test method is useful for characterizing liquid wastes and liquid wastes containing undissolved solids prior to treatment, storage, or stabilization. It has the capability for the simultaneous determination of up to 26 elements.
5.2 The applicable concentration ranges of the elements analyzed by this procedure are listed in Table 1.
1.1 This test method covers the determination of trace, minor, and major elements in waste streams by inductively coupled plasma-atomic emission spectroscopy (ICP-AES) following an acid digestion of the sample. Waste streams from manufacturing processes of nuclear and non-nuclear materials can be analyzed. This test method is applicable to the determination of total metals. Results from this test method can be used to characterize waste received by treatment facilities and to formulate appropriate treatment recipes. The results are also usable in process control within waste treatment facilities.
1.2 This test method is applicable only to waste streams that contain radioactivity levels that do not require special personnel or environmental protection.
1.3 A list of the elements determined in waste streams and the corresponding lower reporting limit is found in Table 1.
1.4 This test method has been used successfully for treatment of a large variety of waste solutions and industrial process liquids. The composition of such samples is highly variable, both between waste stream types and within a single waste stream. As a result of this variability, a single acid digestion scheme may not be expected to succeed with all sample matrices. Certain elements may be recovered on a semi-quantitative basis, while most results will be highly quantitative.
1.5 This test method should be used by analysts experienced in the use of ICP-AES, the interpretation of spectral and non-spectral interferences, and procedures for their correction.
1.6 No detailed operating instructions are provided because of differences among various makes and models of suitable ICP-AES instruments. Instead, the analyst shall follow the instructions provided by the manufacturer of the particular instrument. This test method does not address comparative accuracy of different devices or the precision between instruments of the same make and model.