SJ/T 2214-2015
Measuring methods for semiconductor photodiode and phototransistor (English Version)

Standard No.

SJ/T 2214-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Electron

Latest

SJ/T 2214-2015

Replace

SJ/T 2214.1-1982 SJ/T 2214.2-1982 SJ/T 2214.3-1982 SJ/T 2214.4-1982 SJ/T 2214.5-1982 SJ/T 2214.6-1982 SJ/T 2214.7-1982 SJ/T 2214.8-1982 SJ/T 2214.9-1982 SJ/T 2214.10-1982

Scope

This standard specifies the testing methods for the optoelectronic parameters of semiconductor photodiodes and phototransistors (hereinafter referred to as "devices"). This standard is applicable to the testing of photoelectric parameters of semiconductor photodiodes and phototransistors. This standard does not apply to the testing of PIN and avalanche photodiodes.

SJ/T 2214-2015 history

• 2015 SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
• 0000 SJ/T 2214.10-1982