KS C IEC 62276:2007
Single crystal wafers for surface acoustic wave(SAW) device applications－Specifications and measuring methods

Standard No.

KS C IEC 62276:2007

Release Date

2007

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 62276:2019

Latest

KS C IEC 62276:2019

Scope

This standard is intended to be used as a substrate for manufacturing surface acoustic wave (SAW) filters and resonators.

KS C IEC 62276:2007 history

• 2019 KS C IEC 62276:2019 Single crystal wafers for surface acoustic wave(SAW) device applications — Specifications and measuring methods
• 2007 KS C IEC 62276:2007 Single crystal wafers for surface acoustic wave(SAW) device applications－Specifications and measuring methods