JIS C 6760:2014
Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

Standard No.

JIS C 6760:2014

Release Date

2014

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS C 6760:2014

JIS C 6760:2014 Referenced Document

• JIS C 6704:2009 Synthetic quartz crystal
• JIS Z 9015-1 Sampling procedures for inspection by attributes -- Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection

JIS C 6760:2014 history

• 2014 JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods