KS C IEC 60747-7-2:2006
Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section Two：Blank detail specification for case-rated bipolar transistors for low-frequency amplification

Standard No.

KS C IEC 60747-7-2:2006

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60747-7-2-2006(2016)

Latest

KS C IEC 60747-7-2-2021

Replace

KS C IEC 60747-7-2:2001

Scope

This standard specifies individual specification guidelines for case-rated bipolar transistors for low-frequency amplification.

KS C IEC 60747-7-2:2006 history

• 2021 KS C IEC 60747-7-2-2021 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section Two：Blank detail specification for case-rated bipolar transistors for low-frequency amplification
• 0000 KS C IEC 60747-7-2-2006(2016)
• 2006 KS C IEC 60747-7-2:2006 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section Two：Blank detail specification for case-rated bipolar transistors for low-frequency amplification
• 0000 KS C IEC 60747-7-2:2001