This part of ISO 25178 specifies the metrological properties of phase-shifting interferometric (PSI) microscopy measuring instruments for measuring surface profiles and for surface measurement of surface properties.
EN ISO 25178-603:2013 history
2013EN ISO 25178-603:2013 Geometrical product specifications (GPS) - Surface texture: Areal - Part 603: Nominal characteristics of non-contact (phaseshifting interferometric microscopy) instruments
2009EN ISO 25178-603:2009 Geometrical product specifications (GPS) - Surface texture: Areal - Part 603: Nominal characteristics of non-contact (phase-shifting interferometric microscopy) instruments