ANSI/ESD SP5.2.2-2012
Machine Model (MM) Alternative Test Method: Split Signal Pin - Component Level
- Standard No.
- ANSI/ESD SP5.2.2-2012
- Release Date
- 2013
- Published By
- Electrostatic Discharge Association (ESDA)
- Latest
- ANSI/ESD SP5.2.2-2012
- Scope
- For high pin count components (e.g., ball grid array) with a large number of signal pins, the total number of pins can be reduced by splitting the signal pins into two or more equal sets or subgroups. Special test fixture boards (TFBs) can be constructed to connect each set of signal pins to specific tester channels while floating the remaining unused signal pins. Additional TFBs can be constructed to connect each remaining set of signal pins to specific tester channels while floating the remaining unused signal pins. AU power, ground and control pins on the component should be wired to each TFB. NOTE: ANSI/ESD SP5.2.2 does not cover the testing of supply pins of high pin count devices. It is recommended to use ANSI/ESD SP5.2.1.
ANSI/ESD SP5.2.2-2012 history
- 2013 ANSI/ESD SP5.2.2-2012 Machine Model (MM) Alternative Test Method: Split Signal Pin - Component Level
