DS/EN 62276:2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Standard No.

DS/EN 62276:2013

Release Date

2013

Published By

Danish Standards Foundation

Latest

DS/EN 62276:2013

Replace

DS/EN 62276-2005

Scope

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface

DS/EN 62276:2013 history

• 2013 DS/EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods