JIS K 0189:2013
Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
- Standard No.
- JIS K 0189:2013
- Release Date
- 2013
- Published By
- Japanese Industrial Standards Committee (JISC)
- Latest
- JIS K 0189:2013
JIS K 0189:2013 Referenced Document
- JIS Q 17025 General requirements for the competence of testing and calibration laboratories
JIS K 0189:2013 history
- 2013 JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
