SN/T 3348-2012
Determination of silicon,manganese,phosphorus,chromium,nickel and tungsten in chrome-nickel-tungsten steel.Wave-length dispersive X-ray fluorescence spectrometry (English Version)

Standard No.

SN/T 3348-2012

Language

Chinese, Available in English version

Release Date

2012

Published By

Professional Standard - Commodity Inspection

Latest

SN/T 3348-2012

Scope

This standard specifies the wavelength dispersive X-ray fluorescence spectrometry method for the determination of silicon, manganese, phosphorus, chromium, nickel and tungsten content in chromium-nickel tungsten steel. This standard is applicable to the determination of silicon, manganese, phosphorus, chromium, nickel and tungsten content in chromium-nickel tungsten steel. The measurement range is shown in Table 1.

SN/T 3348-2012 Referenced Document

• GB/T 1031 Geometrical Product Specifications(GPS).Surface texture:Profile method.Surface roughness parameters and their values
• GB/T 16597 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods*， 2019-06-04 Update

SN/T 3348-2012 history

• 2012 SN/T 3348-2012 Determination of silicon,manganese,phosphorus,chromium,nickel and tungsten in chrome-nickel-tungsten steel.Wave-length dispersive X-ray fluorescence spectrometry