BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

Standard No.

BS EN 60749-27:2006+A1:2012

Release Date

2006

Published By

British Standards Institution (BSI)

Latest

BS EN 60749-27:2006+A1:2012

Replace

05/30128292 DC-2005 BS EN 60749:1999 BS EN 60749-27:2006

BS EN 60749-27:2006+A1:2012 history

• 2006 BS EN 60749-27:2006+A1:2012 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
• 2006 BS EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)