LST EN 62374-1-2011
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)

Standard No.

LST EN 62374-1-2011

Release Date

2011

Published By

Lithuanian Standards Office

Latest

LST EN 62374-1-2011

LST EN 62374-1-2011 history

• 2011 LST EN 62374-1-2011 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)