LST EN 60749-38-2008
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008)

Standard No.

LST EN 60749-38-2008

Release Date

2008

Published By

Lithuanian Standards Office

Latest

LST EN 60749-38-2008

LST EN 60749-38-2008 history

• 2008 LST EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008)