LST EN 60749-27-2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006)

Standard No.

LST EN 60749-27-2006

Release Date

2006

Published By

Lithuanian Standards Office

Latest

LST EN 60749-27-2006

LST EN 60749-27-2006 history

• 2006 LST EN 60749-27-2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006)