LST EN 60749-31-2004 Semiconductor devices. Mechanical and climatic test methods. Part 31: Flammability of plastic-encapsulated devices (internally induced) (IEC 60749-31:2002)
2004LST EN 60749-31-2004 Semiconductor devices. Mechanical and climatic test methods. Part 31: Flammability of plastic-encapsulated devices (internally induced) (IEC 60749-31:2002)