LST EN 60749-11-2003 Semiconductor devices. Mechanical and climatic test methods. Part 11: Rapid change of temperature Two-fluid-bath method (IEC 60749-11:2002)
2003LST EN 60749-11-2003 Semiconductor devices. Mechanical and climatic test methods. Part 11: Rapid change of temperature Two-fluid-bath method (IEC 60749-11:2002)