LST EN 60749-16-2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003)

Standard No.

LST EN 60749-16-2003

Release Date

2003

Published By

Lithuanian Standards Office

Latest

LST EN 60749-16-2003

LST EN 60749-16-2003 history

• 2003 LST EN 60749-16-2003 Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003)