LST EN 60749-5-2004
Semiconductor devices - Mechanical and climatic test methods. Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003)

Standard No.

LST EN 60749-5-2004

Release Date

2004

Published By

Lithuanian Standards Office

Status

Be replaced 2015-06

Replace By

LST EN 14399-6-2015

Latest

LST EN 14399-6-2015

LST EN 60749-5-2004 history

• 2015 LST EN 14399-6-2015 High-strength structural bolting assemblies for preloading - Part 6: Plain chamfered washers
• 2004 LST EN 60749-5-2004 Semiconductor devices - Mechanical and climatic test methods. Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003)

LST EN 60749-5-2004 Semiconductor devices - Mechanical and climatic test methods. Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003) was changed to LST EN 14399-6-2015 High-strength structural bolting assemblies for preloading - Part 6: Plain chamfered washers.