DS/EN 61000-4-29:2001 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
This part of IEC 61000 defines test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low voltage d.c. power ports of equipment supplied by external d.c. networks. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. input power ports.
DS/EN 61000-4-29:2001 history
2001DS/EN 61000-4-29:2001 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests