This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.
DS/EN 61000-4-20:2011 history
2011DS/EN 61000-4-20:2011 Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides