DS/EN 60749-11/Corr.2:2004
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Standard No.

DS/EN 60749-11/Corr.2:2004

Release Date

2004

Published By

Danish Standards Foundation

Latest

DS/EN 60749-11/Corr.2:2004

Scope

This part of IEC 60749 defines the rapid change of temperature test method and the two-fluid-bath method. When both test methods are performed as part of a device qualification, results of air to air temperature cycling take priority over this two-fluid-bath test method. This test method may also be used, employing fewer cycles (e.g. 5 to 10 cycles), to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. In general, this rapid change of temperature and two-fluid bath method

DS/EN 60749-11/Corr.2:2004 history

• 2004 DS/EN 60749-11/Corr.2:2004 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
• 2003 DS/EN 60749-11/Corr.1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
• 2003 DS/EN 60749-11:2003 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method