DS/EN 60749-8+Corr.2:2004
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Standard No.

DS/EN 60749-8+Corr.2:2004

Release Date

2004

Published By

Danish Standards Foundation

Latest

DS/EN 60749-8+Corr.2:2004

Scope

This part of IEC 60749 is applicable to semiconductor device (discrete devices and integrated circuits). The object of this test method is to determine the leak rate of semiconductor devices.

DS/EN 60749-8+Corr.2:2004 history

• 2004 DS/EN 60749-8+Corr.2:2004 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing