DS/EN 60749-5:2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Standard No.

DS/EN 60749-5:2003

Release Date

2003

Published By

Danish Standards Foundation

Latest

DS/EN 60749-5:2003

Scope

This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of eveluating the reliability of non-hermetic packaged solid-state devices in humid environments.

DS/EN 60749-5:2003 history

• 2003 DS/EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test